Force Curve & Ramping Analysis

Force Curve analysis functions display the results of experiments where the tip-sample separation is varied at each XY position. Ramping analysis functions are two-dimensional data sets where up to three data channels are measured simultaneously while a control parameter (z-position, tip bias, sample bias, etc...) is varied. During the Ramping, the XY position is held constant.

The following Force Curve analysis and Ramping analysis commands are available in NanoScope Analysis NanoScope 8.15:

• Line Plot & Multiple Line Plot
• Force Curve - Update Sensitivity
• Force Volume Display and Interpretation
• Multiple Curve Analysis (MCA)

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